Solar Industry
Solar Cell PL/EL/IV 3-in-1 Testing System
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
- PL Testing for Wafer ,in-process Cell, Finished Solar Cell
- EL Testing for Finished Solar Cell
- IV Testing for Finished Solar Cell
- Suns-Voc Analysis
- TLM Analysis
- Front and Bulk Defect Separation
- Solar Cell Process Control
- Solar Cell Voc / FF/ EFF loss Analysis and Improvement